| Session 1: | Arrays in Communications: Modeling and Diversity Techniques |
| Date: | 16 March 2000 |
| Time: | 1:30 - 3:00 p.m. |
1.1
A Parametric Spatio-Temporal Channel Estimation Technique for FDD UMTS Uplink
M. Chenu-Tournier, P. Larzabal and J. Barbot (LESIR-ENS de Cachan, France)
[abstract]1.2
Matched Field Processing for DS-CDMA in a Multipath Channel
D. Abraham (Pennsylvania State University, USA)
T. Kirubarajan (University of Connecticut, USA)
D. Gingras (SPAWAR Systems Center, USA)
[abstract]1.3
All-Digital Impulse-Radio for Multiuser Communications Through Multipath
C. Le Martret, G. Giannakis (University of Minnesota, USA)
[abstract]1.4
An Estimation-Based Approach to Multiple-Input Multiple-Output (MIMO) Channel Equalization
A. Tehrani (Stanford University, USA)
B. Hassibi (Bell Laboratories, Lucent Technologies, USA)
J. Cioffi (Stanford University, USA)
[abstract]1.5
Cellular and PCS Propagation Measurements and Statistical Models for Urban Multipath on an Antenna Array
C. Keller, D. Bliss (MIT Lincoln Laboratory, USA)
[abstract]1.6
Coherent Multichannel Reception of Binary Modulated Signals and Independent Rician Fading
V. Ermolayev, A. Flaksman (Mera Scientific Technical Company, Russia)
D. Bevan (Nortel Networks, Harlow Laboratories, UK)
[abstract]1.7
Downlink Intercell Interference Cancellation in WCDMA by Exploiting Transmit Diversity
D. Slock, M. Lenardi (Eurecom Institute, France)
[abstract]1.8
Multiple-Input Multiple-Output (MIMO) Radio Channel Measurements
C. Martin, N. Sollenberger, J. Winters (AT&T Research, USA)
[abstract]1.9
Oversampling Diversity Versus Dual Antenna Diversity for Chip-Level Equalization on CDMA Downlink
T. Krauss, M. Zoltowski (Purdue University, USA)
[abstract]1.10
Bit-Error Probability Analysis of Compact Antenna Arrays with Maximal-Ratio Combining in Correlated Nakagami Fading
J. Luo, J. Zeidler (University of California-San Diego)
S. McLaughlin (University of Edinburgh, Scotland)
[abstract]1.11
Spatial Characterization of Indoor Radio Channel Measurements at 5 GHz
R. Stridh, B. Ottersten (Royal Institute of Technology, Sweden)
[abstract]