ECE 682: VLSI Test Concepts
Course Information from University Catalog
Broad introduction to basic concepts, techniques, and tools of modern VLSI testing. Fundamentals of defect modeling, fault simulation, design for testability, built-in self-test techniques, and failure analysis. Test economics, physical defects and fault modeling, automated test pattern generation, fault simulation, design for test, built-in self test, memory test, PLD test, mixed-signal test, Iddq test, boundary scan and related standards, test synthesis, diagnosis and failure analysis, automated test equipment, embedded core test.
Hours of Lecture or Seminar per week: 3