George Mason University
George Mason University Mason
George Mason University

ECE 682: VLSI Test Concepts

Course Information from University Catalog

Not Repeatable

Broad introduction to basic concepts, techniques, and tools of modern VLSI testing. Fundamentals of defect modeling, fault simulation, design for testability, built-in self-test techniques, and failure analysis. Test economics, physical defects and fault modeling, automated test pattern generation, fault simulation, design for test, built-in self test, memory test, PLD test, mixed-signal test, Iddq test, boundary scan and related standards, test synthesis, diagnosis and failure analysis, automated test equipment, embedded core test.

Hours of Lecture or Seminar per week: 3

Credits: 3


ECE 586